An article by our researcher has been published in the journal Infrared Physics & Technology


Our researcher Alexey I. Moskovchenko is a co-author of an article in a renowned scientific journal Infrared Physics & Technology: A.I. Moskovchenko, V.P. Vavilov, A.O. Chulkov, Comparing the efficiency of defect depth characterization algorithms in the inspection of CFRP by using one-sided pulsed thermal NDT. He has collaborated on the article with researchers from Tomsk Polytechnic University in Russia.

The article is available here.