The method of total emissivity measurement of material surface

Description

The method of total emissivity measurement of material surface

The method enables measurement of total emissivity up to high temperatures. Measurement of the radiation heat flux from the analyzed surface and from the black body is utilized for the evaluation of total value of the emissivity. The measurement is provided under various temperatures and results in temperature dependence of total emissivity.

Analyzed material is heated by laser beam. The radiation heat flux from the analyzed material is measured by noncontact method. Part of the material surface is covered by reference thermographic paint (LabIR paint) to ensure the high and known value of the surface emissivity. The measured values of radiation heat flux and surface temperature of the sample allow evaluation of relative total emissivity of the material. The knowledge of radiation heat flux from blackbody at the same temperature as the analyzed material enables the computation of the absolute total emissivity value from the relative one.

Customer benefits

  • Serves as an input parameter for computer modelling of radiation heat transfer
  • Allows surface modifications and high temperature measurements of surface temperature using non-contact methods
  • Economic benefits resulting from the knowledge of high temperature behaviour of the material

Patent

University of West Bohemia. The method of total emissivity measurement of material surface. Inventors: M. Honner and Z. Veselý. Czech Republic. Patent file CZ 306316 B6. 19.10.2016.

References

BG SYS HT s.r.o., Czech Republic

Contact person

Zdeněk Veselý
Ing. Zdeněk Veselý, Ph.D.
Phone: +420 377 634 832
Email: zvesely@ntc.zcu.cz
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